Oscilloscope Probes

The MicroTec range of test and measurement probes are suitable for use with oscilloscopes, multimeters and other test equipment.

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MI007
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60 MHz oscilloskop Probe X1/X10

This high quality, general purpose oscilloscope probe has a 60 MHz  bandwidth. A two position slide switch allows attenuation of either x1 or x10 to be selected.

TA131
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250 MHz oscilloskop Probe X1/X10

This passive high–impedance scope probe has a 250 MHz  bandwidth and high–frequency trimming. A two position slide switch allows attenuation of either x1 or x10 to be selected.

TA049
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500 MHz oscilloskop Probe x10

The TA049 is a passive high-impedance oscilloscope probe designed and calibrated for use on instruments having an input impedance of 1 MΩ shunted by 15 pF. However, it may be compensated for use with instruments having an input capacitance of 10 to 35 pF. The probe has a further three trimmers for high-frequency compensation adjustment.
TA041
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Differential oscilloskop probe X10/X100

The ADF25A is an active differential oscilloscope probe. The probe permits the measurement of signals which are not referenced to earth using a conventional earthed oscilloscope. This enables mains voltages to be tested. It is possible to measure and observe the waveforms of three phase supplies or the gate / control signals of semiconductor circuits. It is ideal for investigation of motor speed controls, uninterruptible power supplies, switch mode power supplies and process controllers.